International Standard
ISO/TR 22335:2007
Surface chemical analysis — Depth profiling — Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
Reference number
ISO/TR 22335:2007
Edición 1
International Standard
Vista previa
ISO/TR 22335:2007
No disponible en español
Publicado (Edición 1, 2007)
Esta norma se revisó y confirmó por última vez en 2020. Por lo tanto, esta versión es la actual.

ISO/TR 22335:2007

ISO/TR 22335:2007
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ISO/TR 22335:2007 describes a method for determining ion-sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X‑ray photoelectron spectroscopy (XPS) where the specimen is ion-sputtered over a region with an area between 0,4 mm2 and 3,0 mm2. The Technical Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time.

The Technical Report provides a method to convert the ion-sputtering time scale to sputtered depth in a depth profile by assuming a constant sputtering velocity. This method has not been designed for, or tested using, a scanning probe microscope system. It is not applicable to the case where the sputtered area is less than 0,4 mm2 or where the sputter-induced surface roughness is significant compared with the sputtered depth to be measured.

Informaciones generales

  •  : Publicado
     : 2007-07
    : Norma Internacional confirmada [90.93]
  •  : 1
     : 18
  • ISO/TC 201/SC 4
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