Résumé
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Informations générales
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État actuel: ProjetStade: Nouveau projet enregistré au programme de travail du TC/SC [20.00]
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Edition: 1
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Comité technique :ISO/TC 229
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