This standard has been revised by ISO 6342:2003
Abstract
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
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Status: WithdrawnPublication date: 1993-08
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Edition: 1Number of pages: 3
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Technical Committee: ISO/TC 171/SC 2 Document file formats, EDMS systems and authenticity of information
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- ICS :
- 37.080 Document imaging applications
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