This standard was last reviewed and confirmed in 2021.
Therefore this version remains current.
Abstract
PreviewISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
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Status: PublishedPublication date: 2011-12
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Edition: 1Number of pages: 2
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- ICS :
- 19.100 Non-destructive testing
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| Format | Language | |
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| std 1 40 | ||
| std 2 40 | Paper |
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