ISO 17901-2:2015
p
ISO 17901-2:2015
60947

Status : Published (Under review)

This standard was last reviewed and confirmed in 2020. Therefore this version remains current.
en
Format Language
std 1 129 PDF
std 2 129 Paper
  • CHF129
Convert Swiss francs (CHF) to your currency

Abstract

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

Read sample 

Preview this standard in our Online Browsing Platform (OBP)

General information

  •  : Published
     : 2015-07
    : International Standard confirmed [90.93]
  •  : 1
     : 20
  • ISO/TC 172/SC 9
    31.020 
  • RSS updates

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)