ISO 17470:2014

This standard was last reviewed and confirmed in 2019. Therefore this version remains current.

Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm³ scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

Status
: Published

Publication date
: 2014-01
Edition
: 2

Number of pages
: 10
Technical Committee
: ISO/TC 202/SC 2 Electron probe microanalysis
ICS
:
71.040.99 Other standards related to analytical chemistry

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	Format	Language
std 1 61	PDF + ePub
std 2 61	Paper

CHF61

Life cycle

Previously

Withdrawn

ISO 17470:2004
Now

Published

ISO 17470:2014

A standard is reviewed every 5 years
Stage: 90.93 (Confirmed)

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