Numéro de référence
ISO 20263:2017
ISO 20263:2017
Analyse par microfaisceaux — Microscopie électronique analytique — Méthode de détermination de la position d'interface dans l'image de coupe transversale des matériaux en couches
Edition 1
2017-11
Annulée
ISO 20263:2017
67438
Annulée (Edition 1, 2017)

Résumé

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

Informations générales

  •  : Annulée
     : 2017-11
    : Annulation de la Norme internationale [95.99]
  •  : 1
  • ISO/TC 202/SC 3
    37.020  71.040.50 
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