Abstract
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
General information
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Status: WithdrawnPublication date: 2009-09Stage: Withdrawal of International Standard [95.99]
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Edition: 1Number of pages: 43
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Technical Committee :ISO/TC 202ICS :71.040.50
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Life cycle
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Now
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Revised by
PublishedISO 24173:2024