ISO/DIS 23131-3

En desarrollo

Este borrador de Norma Internacional se encuentra en la fase de consultas con los miembros de ISO.

Resumen

This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a transparent layer and the optical (refractive index n) or dielectric (real part ε1) constants/functions based on the transparent single layer model within a spectral region, for which k = 0 applies.